A simple method to clean ligand contamination on TEM grids

Colloidal nanoparticles (NPs) including nanowires and nanosheets made by chemical methods involve many organic ligands. When the structure of NPs is investigated via transmission electron microscopy (TEM), ligands act as a source for e-beam induced deposition this causes substantial build-up carbon layers in areas, which typically referred to “contamination” field microscopy. This contamination often more severe scanning TEM, technique that based on focused beam hence higher dose rate. In paper, we report simple effective method clean drop-cast TEM grids contain with Using combination activated ethanol, effectively reduces amount grids, therefore greatly improves quality images subsequent analytical measurements. efficient facile can be helpful during investigation different kinds nanomaterials suffer from ligand-induced contamination.